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Look Inside The Principles and Practice of Electron Microscopy

The Principles and Practice of Electron Microscopy

2nd Edition

$143.00 (X)

  • Date Published: March 1997
  • availability: Available
  • format: Paperback
  • isbn: 9780521435918

$ 143.00 (X)

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About the Authors
  • This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practicing electron microscopists. He describes currently hot topics such as computer control of microscopes, energy-filtered imaging, cryomicroscopy and environmental microscopy, digital imaging, high resolution scanning, and transmission microscopy. The author has expanded the highly praised case studies of the first edition to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years' practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.

    • Very highly praised in reviews of the first edition
    • Completely updated to include improvements to the technique
    • Author has over thirty years practical experience of the technique
    • For researchers and graduate students in materials science, earth sciences, biology and physics
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    Reviews & endorsements

    "This book combines the practical aspects of electron microscopy with just enough theory to capture the interests at all levels. The generous use of examples and the wealth of topics covered make this an attractive textbook for an introductory course in electron microscopy...The discussion of related analytical methods such as SEAM, Spin SEM, and FIM is very welcome in a book of this type and the appendix is also detailed and informative. In short, a reader will find in this book useful information about instrumentation and technique in very readable form, which can be understood and put into practice with a minimum of additional effort." Scanning, The Journal of Scanning Microscopies

    "...a must read for any person interested in finding out about this broad discipline...a descriptive, visually oriented text, with many informative figures and stunning electron micrograph images." The Leading Edge

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    Product details

    • Edition: 2nd Edition
    • Date Published: March 1997
    • format: Paperback
    • isbn: 9780521435918
    • length: 500 pages
    • dimensions: 247 x 189 x 27 mm
    • weight: 0.89kg
    • contains: 384 b/w illus. 4 tables
    • availability: Available
  • Table of Contents

    1. Microscopy with light and electrons
    2. Electron/specimen interactions: processes and detectors
    3. The electron microscope family
    4. Specimen preparation for electron microscopy
    5. The interpretation and analysis of micrographs
    6. Analysis in the electron microscope
    7. Specialised techniques in EM, and other microscopical and analytical techniques
    8. Examples of the use of electron microscopy
    Appendix 1. Production and measurement of high vacua
    Appendix 2. Vacuum deposition of thin metallic and carbon films for electron microscopy
    Appendix 3. X-ray spectrometry
    Appendix 4. Electron sources for electron microscopes
    Additional literature
    Names and addresses of electron microscope manufacturers and their agents

  • Author

    Ian M. Watt, Johnson Matthey Technology Centre

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