Skip to content
Register Sign in Wishlist

Extended Defects in Semiconductors
Electronic Properties, Device Effects and Structures


  • Authors:
  • D. B. Holt, Imperial College of Science, Technology and Medicine, London
  • B. G. Yacobi, University of Toronto
  • Date Published: August 2014
  • availability: Available
  • format: Paperback
  • isbn: 9781107424142
Average user rating
(1 review)

£ 56.99

Add to cart Add to wishlist

Other available formats:
Hardback, eBook

Looking for an inspection copy?

This title is not currently available on inspection

Product filter button
About the Authors
  • The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

    • A comprehensive survey, in one volume, of extended structural defects in semiconductors
    • Suitable as a reference text for researchers but also as a textbook for graduate students
    • Timely, in view of advances in electronic device development, which involve defect control and engineering at the nanometer level
    Read more

    Reviews & endorsements

    'This new book is … a welcome addition, covering as it does extended defects in semiconductors from the basics to the current state-of-the-art. … extremely readable with a clear, concise style. The presentation is classic, eschewing 'break-out boxes' and other more modern layout innovations in favour of a traditional straight text. The diagrams are equally no nonsense: simple clear line drawings, which as a result effectively convey what are sometimes complex concepts. Lots to crib from here for lecture presentations! … In their quest to create a single book covering such a large subject area the authors have been surprisingly successful, and the result is an interesting, readable book that serves both as an excellent introduction for postgraduates and a useful reference for those in the field. … it will no doubt become a regularly consulted reference work in every materials science library.' Chemistry World

    Customer reviews

    30th Jun 2019 by Morino

    Very convinient and easy to use.I want to use it in the future.

    Review was not posted due to profanity


    , create a review

    (If you're not , sign out)

    Please enter the right captcha value
    Please enter a star rating.
    Your review must be a minimum of 12 words.

    How do you rate this item?


    Product details

    • Date Published: August 2014
    • format: Paperback
    • isbn: 9781107424142
    • length: 644 pages
    • dimensions: 244 x 170 x 33 mm
    • weight: 1.01kg
    • availability: Available
  • Table of Contents

    1. Semiconducting materials
    2. An introduction to extended defects
    3. Characterization of extended defects in semiconductors
    4. Core structures and mechanical effects of extended defects specific to semiconductors
    5. The electrical, optical and device effects of dislocations and grain boundaries
    6. Point defect materials problems.

  • Authors

    D. B. Holt, Imperial College of Science, Technology and Medicine, London
    David Holt is an Emeritus Professor in the Department of Materials at Imperial College, London. He obtained his doctorate in Physical Metallurgy from the University of Birmingham, UK, in 1956, after which he held a number of academic positions over five years in the physics department at the University of the Witwatersrand, South Africa, before moving to the Department of Metallurgy at Imperial College, London. He has remained at Imperial College since then, except for a sabbatical year in the School of Physics at the University of New South Wales, Australia, and shorter periods at the Indian Institute of Technology, Kanpur, India. He has been a regular visitor at the Maspec Institute (now part of IMEM) in Parma, Italy. He researched the science and technology of semiconducting materials and devices and developed and applied techniques for their characterization in the scanning electron microscope. He is author or co-author of approximately 150 scientific publications and has co-authored or edited five previous books.

    B. G. Yacobi, University of Toronto
    Ben Yacobi is an Adjunct Professor in the Department of Materials Science and Engineering at the University of Toronto. He received his doctorate in physics from the Hebrew University of Jerusalem in 1975. He held post-doctoral positions at Imperial College, London, and Harvard University, Massachusetts, and technical staff positions at the Solar Energy Research Institute and GTE Laboratories, US. He has worked in several areas of experimental solid-state physics, including the synthesis, applications and characterization of various electronic and photonic materials and devices. He is author or co-author of over ninety scientific publications and four previous books.

Sign In

Please sign in to access your account


Not already registered? Create an account now. ×

Sorry, this resource is locked

Please register or sign in to request access. If you are having problems accessing these resources please email

Register Sign in
Please note that this file is password protected. You will be asked to input your password on the next screen.

» Proceed

You are now leaving the Cambridge University Press website. Your eBook purchase and download will be completed by our partner Please see the permission section of the catalogue page for details of the print & copy limits on our eBooks.

Continue ×

Continue ×

Continue ×

Find content that relates to you

Join us online

This site uses cookies to improve your experience. Read more Close

Are you sure you want to delete your account?

This cannot be undone.


Thank you for your feedback which will help us improve our service.

If you requested a response, we will make sure to get back to you shortly.

Please fill in the required fields in your feedback submission.