Skip to content
Register Sign in Wishlist
Look Inside The Principles and Practice of Electron Microscopy

The Principles and Practice of Electron Microscopy

2nd Edition

£107.00

  • Date Published: January 1997
  • availability: Available
  • format: Paperback
  • isbn: 9780521435918

£ 107.00
Paperback

Add to cart Add to wishlist

Looking for an inspection copy?

This title is not currently available on inspection

Description
Product filter button
Description
Contents
Resources
Courses
About the Authors
  • The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.

    • Very highly praised in reviews of the first edition
    • Completely updated to include improvements to the technique
    • Author has over thirty years practical experience of the technique
    • For researchers and graduate students in materials science, earth sciences, biology and physics
    Read more

    Reviews & endorsements

    '… a tremendously readable account of modern electron microscopes and their capabilities, with excellent informative illustrations; its usefulness will not be confined to outsiders and newcomers.' Applied Optics

    '… a useful addition to any general electron microscopy laboratory.' The Times Higher Education Supplement

    '… a very useful handbook for anyone in solid state or materials science.' Philosophical Magazine

    '… an exceptionally useful work … there can be little doubt that the book will find its rightful place on the shelves of most students ands practitioners.' Micron and Microscopica Acta

    '… a very readable book aimed at the novice with limited mathematical background, but it will also be useful to practitioners in one branch of electron microscopy who would like to know what other instruments and techniques can offer … The text is easy to follow, the diagrams are simple, informative and clear, and the photographs are of high quality.' P. E. Champness Geological Magazine

    ' … a most readable non-mathematical overview of the development of the various fields of electron microscopy. It is a volume well worth having on one's bookshelf.' Jaakko Keränen, Microscopy

    'The principles and practice of electron microscopy provides a most readable non-mathematical overview of the development of the various fields of electron microscopy, suited also to a nonspecialist … This book satisfies all the requirements for an introductory text. It is a volume well worth having on one's bookshelf.' Jaakko Keränen, Microscopy and Analysis

    See more reviews

    Customer reviews

    Not yet reviewed

    Be the first to review

    Review was not posted due to profanity

    ×

    , create a review

    (If you're not , sign out)

    Please enter the right captcha value
    Please enter a star rating.
    Your review must be a minimum of 12 words.

    How do you rate this item?

    ×

    Product details

    • Edition: 2nd Edition
    • Date Published: January 1997
    • format: Paperback
    • isbn: 9780521435918
    • length: 500 pages
    • dimensions: 247 x 189 x 27 mm
    • weight: 0.89kg
    • contains: 384 b/w illus. 4 tables
    • availability: Available
  • Table of Contents

    1. Microscopy with light and electrons
    2. Electron/specimen interactions: processes and detectors
    3. The electron microscope family
    4. Specimen preparation for electron microscopy
    5. The interpretation and analysis of micrographs
    6. Analysis in the electron microscope
    7. Specialised techniques in EM, and other microscopical and analytical techniques
    8. Examples of the use of electron microscopy
    Appendix 1. Production and measurement of high vacua
    Appendix 2. Vacuum deposition of thin metallic and carbon films for electron microscopy
    Appendix 3. X-ray spectrometry
    Appendix 4. Electron sources for electron microscopes
    Bibliography
    Additional literature
    Names and addresses of electron microscope manufacturers and their agents
    Index.

  • Author

    Ian M. Watt, Johnson Matthey Technology Centre

Sign In

Please sign in to access your account

Cancel

Not already registered? Create an account now. ×

Sorry, this resource is locked

Please register or sign in to request access. If you are having problems accessing these resources please email lecturers@cambridge.org

Register Sign in
Please note that this file is password protected. You will be asked to input your password on the next screen.

» Proceed

You are now leaving the Cambridge University Press website. Your eBook purchase and download will be completed by our partner www.ebooks.com. Please see the permission section of the www.ebooks.com catalogue page for details of the print & copy limits on our eBooks.

Continue ×

Continue ×

Continue ×

Find content that relates to you

Join us online

This site uses cookies to improve your experience. Read more Close

Are you sure you want to delete your account?

This cannot be undone.

Cancel

Thank you for your feedback which will help us improve our service.

If you requested a response, we will make sure to get back to you shortly.

×
Please fill in the required fields in your feedback submission.
×