Skip to content
Register Sign in Wishlist

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

£39.99

  • Date Published: August 2005
  • availability: Available
  • format: Paperback
  • isbn: 9780521017954

£ 39.99
Paperback

Add to cart Add to wishlist

Other available formats:
Hardback, eBook


Looking for an inspection copy?

This title is not currently available on inspection

Description
Product filter button
Description
Contents
Resources
Courses
About the Authors
  • In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

    • self-contained study
    • first book of this scope
    • contains FORTRAN source code
    Read more

    Reviews & endorsements

    'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography … It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology

    'For those with a TEM background it represents, perhaps, the definitive text for reflection methods … extremely readable … attractive style … Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst

    ' … a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy

    ' … this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide

    See more reviews

    Customer reviews

    Not yet reviewed

    Be the first to review

    Review was not posted due to profanity

    ×

    , create a review

    (If you're not , sign out)

    Please enter the right captcha value
    Please enter a star rating.
    Your review must be a minimum of 12 words.

    How do you rate this item?

    ×

    Product details

    • Date Published: August 2005
    • format: Paperback
    • isbn: 9780521017954
    • length: 460 pages
    • dimensions: 244 x 170 x 25 mm
    • weight: 0.731kg
    • contains: 224 b/w illus. 10 tables
    • availability: Available
  • Table of Contents

    1. Kinematical electron diffraction
    Part I. Diffraction of Reflected Electrons:
    2. Reflection high-energy electron diffraction
    3. Dynamical theories of RHEED
    4. Resonance reflections in RHEED
    Part II. Imaging of Reflected Electrons:
    5. Imaging in TEM
    6. Contrast mechanisms of reflected electron imaging
    7. Applications of UHV REM
    8. Applications of non-UHV REM
    Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED
    10. Valence excitation in RHEED
    11. Atomic inner-shell excitations in RHEED
    12. Novel techniques associated with reflection electron imaging
    Appendix A. Physical constants, electron wavelengths and wave numbers
    Appendix B. Crystal inner potential and atomic scattering factor
    Appendix C.1. Crystallographic structure systems
    Appendix C.2. FORTRAN program for calculating crystallographic data
    Appendix D. Electron diffraction patterns of several types of crystals structures
    Appendix E. FORTRAN programs
    Appendix F. Bibliography of REM, SREM and REELS
    References.

  • Author

    Zhong Lin Wang, Georgia Institute of Technology

Sign In

Please sign in to access your account

Cancel

Not already registered? Create an account now. ×

Sorry, this resource is locked

Please register or sign in to request access. If you are having problems accessing these resources please email lecturers@cambridge.org

Register Sign in
Please note that this file is password protected. You will be asked to input your password on the next screen.

» Proceed

You are now leaving the Cambridge University Press website. Your eBook purchase and download will be completed by our partner www.ebooks.com. Please see the permission section of the www.ebooks.com catalogue page for details of the print & copy limits on our eBooks.

Continue ×

Continue ×

Continue ×

Find content that relates to you

Join us online

This site uses cookies to improve your experience. Read more Close

Are you sure you want to delete your account?

This cannot be undone.

Cancel

Thank you for your feedback which will help us improve our service.

If you requested a response, we will make sure to get back to you shortly.

×
Please fill in the required fields in your feedback submission.
×