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Reflection Electron Microscopy and Spectroscopy for Surface Analysis


  • Date Published: August 2005
  • availability: Available
  • format: Paperback
  • isbn: 9780521017954

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About the Authors
  • In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

    • self-contained study
    • first book of this scope
    • contains FORTRAN source code
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    Reviews & endorsements

    'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography … It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology

    'For those with a TEM background it represents, perhaps, the definitive text for reflection methods … extremely readable … attractive style … Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst

    ' … a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy

    ' … this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide

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    Product details

    • Date Published: August 2005
    • format: Paperback
    • isbn: 9780521017954
    • length: 460 pages
    • dimensions: 244 x 170 x 25 mm
    • weight: 0.731kg
    • contains: 224 b/w illus. 10 tables
    • availability: Available
  • Table of Contents

    1. Kinematical electron diffraction
    Part I. Diffraction of Reflected Electrons:
    2. Reflection high-energy electron diffraction
    3. Dynamical theories of RHEED
    4. Resonance reflections in RHEED
    Part II. Imaging of Reflected Electrons:
    5. Imaging in TEM
    6. Contrast mechanisms of reflected electron imaging
    7. Applications of UHV REM
    8. Applications of non-UHV REM
    Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED
    10. Valence excitation in RHEED
    11. Atomic inner-shell excitations in RHEED
    12. Novel techniques associated with reflection electron imaging
    Appendix A. Physical constants, electron wavelengths and wave numbers
    Appendix B. Crystal inner potential and atomic scattering factor
    Appendix C.1. Crystallographic structure systems
    Appendix C.2. FORTRAN program for calculating crystallographic data
    Appendix D. Electron diffraction patterns of several types of crystals structures
    Appendix E. FORTRAN programs
    Appendix F. Bibliography of REM, SREM and REELS

  • Author

    Zhong Lin Wang, Georgia Institute of Technology

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